Machine vision for defect detection and recognition has evolved from classical image‐processing workflows—such as thresholding, edge detection and template matching—to sophisticated deep learning ...

Newswise — Researchers at the University of Illinois Urbana-Champaign have developed a new method for detecting defects in additively manufactured components. One of the most important tasks in any ...

Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...

Few ideas in modern manufacturing are as deceptively simple, and as stubbornly difficult, as teaching a machine to recognize when something looks wrong. A production line may turn out thousands of ...

A study published in Molecules and led by researchers from the Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP) of the Chinese Academy of Sciences demonstrated how deep learning can ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

Vision inspection systems for glass defect detection are industrial vision inspection systems designed to automatically detect minute scratches, foreign objects, bubbles, cracks, surface ...